20 results
Development of a High Electron Energy-loss Spectrometry System for Advanced Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2644-2647
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- August 2022
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Exploiting the Full Potential of the Advanced Two-hexapole Corrector for STEM
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2634-2635
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- August 2022
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Off-axis Electron Holography on 2D Materials with Small Coherent and Incoherent Aberrations
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 128-129
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- August 2021
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Test and Characterization of a New Post-column Imaging Energy Filter
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2634-2635
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- August 2020
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On the Benefit of Aberration Correction in Cryo Electron Microscopy
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2156-2157
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- August 2020
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Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2150-2151
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- August 2020
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Direct Correction of Residual Symmetric Aberrations in Electron Holograms of Weak Phase Objects
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 98-99
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- August 2019
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Electron Microscopy with Structured Electrons
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 448-449
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- July 2017
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Engineering the Contrast Transfer through the Cc/Cs Corrected 20-80 kV SALVE Microscope
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 880-881
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- July 2016
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Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kVSALVEImages of 2D-objects Matches Calculations
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 894-895
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- July 2016
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Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 878-879
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- July 2016
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Approaching the “Lab in the Gap”: First Results from a Versatile In-situ (S)TEM
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 99-100
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- August 2015
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On Proper Phase Contrast Imaging in Aberration Corrected TEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 926-927
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- August 2014
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Aberration-Corrected STEM by Means of Diffraction Gratings
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 946-947
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- August 2014
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Atomic-resolution Imaging Using Cs-corrected Vortex Beams
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 84-85
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- August 2014
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Efficient Diffractive Phase Optics for Electrons
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 356-357
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- August 2014
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A Dedicated In-situ Off-axis Electron Holography (S)TEM: Concept and Electron-Optical Performance.
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1650-1651
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- August 2014
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Establishing an applied training session in metrology at an agricultural engineering school (CIRAD, Montpellier, France)
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- International Journal of Metrology and Quality Engineering / Volume 5 / Issue 4 / 2014
- Published online by Cambridge University Press:
- 02 December 2014, 404
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- 2014
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Aberration Correction and Electron Holography
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- Microscopy and Microanalysis / Volume 16 / Issue 4 / August 2010
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- 05 July 2010, pp. 434-440
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- August 2010
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Electron Holography with a Cs-Corrected Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 14 / Issue 1 / February 2008
- Published online by Cambridge University Press:
- 21 December 2007, pp. 68-81
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- February 2008
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